Numerical calculation of electric field enhancement in neutron traps with rough walls coated with superfluid helium

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

A film of liquid helium on the surface of material traps for ultra-cold neutrons protects the neutrons from being absorbed by the trap walls. By using surface roughness and an electrostatic field, it is possible to maintain a helium film of sufficient thickness throughout the height of the trap. Our study includes a numerical calculation of the field distribution near the tip of various forms of such wall roughness of the trap and the discussion how this field helps to hold the helium film.

Толық мәтін

Рұқсат жабық

Авторлар туралы

V. Kochev

National University of Science and Technology «MISIS»

Email: grigorev@itp.ac.ru
Ресей, Moscow

T. Mogilyuk

National Research Centre «Kurchatov Institute»

Email: grigorev@itp.ac.ru
Ресей, Moscow

S. Kostenko

Federal Research Center of Problems of Chemical Physics and Medicinal Chemistry of the Russian Academy of Sciences

Email: grigorev@itp.ac.ru
Ресей, Chernogolovka

P. Grigoriev

National University of Science and Technology «MISIS»; L.D. Landau Institute for Theoretical Physics of the Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: grigorev@itp.ac.ru
Ресей, Moscow; Chernogolovka

Әдебиет тізімі

  1. Abele H. // Progr. Part. Nucl. Phys. 2008. V. 60. No. 1. P. 1.
  2. Ramsey-Musolf M.J., Su S. // Phys. Reports. 2008. V. 456. No. 1. P. 1.
  3. Dubbers D., Schmidt M.G. // Rev. Mod. Phys. 2011. V. 83. No. 4. P. 1111.
  4. Wietfeldt F.E., Greene G.L. // Rev. Mod. Phys. 2011. V. 83. No. 4. P. 1173.
  5. Gonzalez-Alonso M., Naviliat-Cuncic O., Severijns N. // Progr. Part. Nucl. Phys. 2019. V. 104. P. 165.
  6. Liu J., Mendenhall M.P., Holley A.T. et al. // Phys. Rev. Lett. 2010. V. 105. No. 18. Art. No. 181803.
  7. Märkisch B., Mest H., Saul H. et al. // Phys. Rev. Lett. 2019. V. 122. No. 24. Art. No. 242501.
  8. Sun X., Adamek E., Allgeier B. et al. // Phys. Rev. C. 2020. V. 101. No. 3. Art. No. 035503.
  9. Serebrov A.P., Varlamov V.E., Kharitonov A.G. et al. // Phys. Rev. C. 2008. V. 78. No. 3. Art. No. 035505.
  10. Arzumanov S., Bondarenko L., Chernyavsky S. et al. // Phys. Lett. B. 2015. V. 745. Art. No. 79.
  11. Cеребров А.П., Коломенский Е.А., Фомин А.К. и др. // Письма в ЖЭТФ. 2017. Т. 106. № 10. С. 599; Serebrov A.P., Kolomenskiy E.A., Fomin A.K. et al. // JETP Lett. 2017. V. 106. No. 10. P. 623.
  12. Serebrov A.P., Kolomenskiy E.A., Fomin A.K. et al. // Phys. Rev. C. 2018. V. 97. No. 5. Art. No. 055503.
  13. Pattie R. ., Callahan N.B., Cude-Woods C. et al. // EPJ Web Conf. 2019. V. 219. Art. No. 03004.
  14. Huffman P.R., Brome C.R., Butterworth J.S. et al. // Nature. 2000. V. 403. No. 6765. P. 62.
  15. Leung K.K.H., Geltenbort P., Ivanov S. et al. // Phys. Rev. C. 2016. V. 94. No. 4. Art. No. 045502.
  16. Steyerl A., Leung K.K.H., Kaufman C. et al. // Phys. Rev. C. 2017. V. 95. No. 3. Art. No. 035502.
  17. Ezhov V.F., Andreev A.Z., Bazarov B.A. et al. // JETP Lett. 2018. V. 107. No. 11. P. 671.
  18. Pattie R.W., Callahan N.B., Cude-Woods C. et al. // Science. 2018. V. 360. No. 6389. P. 627.
  19. Gonzalez F.M., Fries E.M., Cude-Woods C. et al. // Phys. Rev. Lett. 2021. V. 127. No. 16. Art. No. 162501.
  20. Nico J.S., Dewey M.S., Gilliam D.M. et al. // Phys. Rev. C. 2005. V. 71. No. 5. Art. No. 055502.
  21. Yue A.T., Dewey M.S., Gilliam D.M. et al. // Phys. Rev. Lett. 2013. V. 111. No. 22. Art. No. 222501.
  22. Hirota K., Ichikawa G., Ieki S. // Progr. Theor. Exp. Phys. 2020. V. 2020. No. 12. Art. No. 123C02.
  23. Grigoriev P.D., Dyugaev A.M. // Phys. Rev. C. 2021. V. 104. No. 5. Art. No. 055501.
  24. Григорьев П.Д., Дюгаев А.М., Могилюк Т.И., Григорьев А.Д. // Письма в ЖЭТФ. 2021. Т. 114. № 8. С. 560; Grigoriev P.D., Dyugaev A.M., Mogilyuk T.I., Grigoriev A.D. // JETP Lett. 2021. V. 114. No. 8. P. 493.
  25. Grigoriev P.D., Sadovnikov A.V., Kochev V.D., Dyugaev A.M. // Phys. Rev. C. 2023. V. 108. No. 2. Art. No. 025501.
  26. Golub R., Jewell C., Ageron P. et al. // Z. Phys. B. Cond. Matter. 1983. V. 51. No. 3. P. 187.
  27. Bokun R.C. // Sov. J. Nucl. Phys. 1984. V. 40. No. 1. P. 287.
  28. Aлфименков В.П., Игнатович В.К., Межов-Деглин Л.П. и др. // Препринт ОИЯИ. № 3-2009-197. Дубна, 2009.
  29. Aлексеев И.Е., Белов С.Е., Ершов К.В. // Изв. РАН. Сер. физ. 2022. T. 86. № 9. С. 1315; Alekseev I.E., Belov S.E., Ershov K.V. // Bull. Russ. Acad. Sci. Phys. 2022. V. 86. No. 9. P. 1088.
  30. Григорьев С.В., Коваленко Н.А., Павлов К.А. и др. // Изв. РАН. Сер. физ. 2023. T. 87. № 11. С. 1526; Grigoriev S.V., Kovalenko N.A., Pavlov K.A. et al. // Bull. Russ. Acad. Sci. Phys. 2023. V. 87. No. 11. P. 1561.
  31. Grigoriev P.D., Zimmer O., Grigoriev A.D., Ziman T. // Phys. Rev. C. 2016. V. 94. No. 2. Art. No. 025504.
  32. Florkowska B., Wlodek R. // IEEE Trans. Electr. Insul. 1993. V. 28. No. 6. P. 932.
  33. Arndt D., Bangerth W., Davydov D. et al. // J. Comput. Math. Appl. 2021. V. 81. P. 407.
  34. Geuzaine C., Remacle J.F. // Int. J. Numer. Meth. Eng. 2009. V. 79. No. 11. P. 1309.
  35. Marchetti S., Rozzi T. // IEEE Trans. Antennas Propag. 1990. V. 38. No. 9. P. 1333.
  36. Ito T.M., Ramsey J.C., Yao W. et al. // Rev. Sci. Instrum. 2016. V. 87. No. 4. Art. No. 045113.
  37. Bourgin Y., Jourlin Y., Parriaux O. et al. // Opt. Express. 2010. V. 18. No. 10. P. 10557.

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
Жүктеу
2. Fig. 1. Calculation grid of finite elements for pyramids of size 𝑙R = ℎR = 1 μm. Distribution of electric field amplification factor is shown in color.

Жүктеу (40KB)
Метадеректер
3. Fig. 2. Electric field amplification near the roughness tip of the trap wall.

Жүктеу (12KB)
Метадеректер
4. Fig. 3. Curves from Fig. 2 in double logarithmic scale.

Жүктеу (11KB)
Метадеректер

© Russian Academy of Sciences, 2024